Agilent Technologies… Microwave Mentoring (Network Analyzer)

[SatNews] The world’s highest performing 67 GHz PNA-X Series vector network analyzer (VNA) has debuted from Agilent Technologies (NYSE: A).

The new N5247A 67 GHz PNA-X allows engineers, working up to 67 GHz, to benefit from Agilent’s single-connection, multiple-measurement, PNA-X platform. This level of performance makes it possible for the N5247A PNA-X to be used in the widest range of microwave applications, including active device characterization and tests; device modeling; high-speed digital; and material research. Agilent will demonstrate the 67 GHz PNA-X, along with other products and services for wireless communication; radar; RF technologies; high-frequency semiconductors; electromagnetic; commercial and military RF; microwave; and mm-wave electronics and applications, at the European Microwave Week 2010, Sept. 26 – Oct. 1, Paris, CNIT La Défense, Booth 62/46.

The N5247A PNA-X delivers +10 dBm output power; 110 dB system dynamic range; and a 0.1 dB receiver compression point of +11 dBm specified at 67 GHz. These specifications are 8 dB more output power and 7 dB more dynamic range than any other VNA in the industry. This unmatched performance enables the N5247A PNA-X to provide the world’s most accurate linear and nonlinear active component characterization in a single instrument. Like all Agilent PNA-X models, the N5247A features clean internal dual sources, a built-in combiner and path switches. These features enable a unique single-connection solution for S-parameters, noise figure and intermodulation distortion (IMD) measurements. It also makes it possible to perform many other measurements that are required for testing active devices up to 67 GHz. This includes pulse; gain compression; harmonics and spectrum for amplifiers; mixers; and frequency converters. Traditionally, similar tasks have required multiple test instruments. By integrating the capabilities of a full rack of equipment into a single instrument, the 67 GHz PNA-X reduces equipment count by 50 percent and decreases test time by a factor of four to 20 times. A single contact solution for on-wafer tests eliminates the need for multiple probe contacts and operator intervention, enabling the most accurate characterization and reliable wire-bonding.

A key feature of the N5247A PNA-X is its ability to be expanded from a 10 MHz to a 2- or 4-port 110 GHz single-sweep mm-wave solution. The solution provides power leveling, true differential, and frequency converter measurement capabilities. As the industry’s first 4-port, 110 GHz single-sweep solution, the N5247A can characterize mixers/converters and differential devices with continuous measurements over the entire operating frequency range. Providing superior performance and reduced cost of ownership, the 110 GHz PNA-X mm-wave solution offers a direct replacement for the industry-standard 8510XF broadband 110 GHz system.